FCK3109 Electron Microscopy Analysis of Fibre and Polymer-based Materials
KTH Royal Institute of Technology
Eligible for studies at the third-cycle level.
The course presents the basic principles of different types of:
- Electron microscopy techniques: scanning electron microscopy (SEM), table top-SEM, transmission electron microscopy (TEM), cryo-SEM, cryo-TEM, focused ion beam (FIB), Dual Beam (SEM-FIB), energy dispersive X-ray spectroscopy (EDS).
- More advanced analysis techniques (in situ analysis) and 3D tomography.
- Different types of sample preparation techniques for optimal analysis of a specific sample.
- Hands-on experience of electron microscopy imaging.
After completion of the course the doctoral student should have the knowledge and ability to
- Explain the basic principles for electron microscopy (scanning electron and transmission electron microscopy), and demonstrate for the level of the course adequate acquired knowledge in the specialized topics of the course.
- Suggest and explain, plan and carry out different types of electron microscopy related experiments.
- Suggest, plan and perform sample preparation of a material so that it can be imaged with electron microscopy. Reflect on the selected sample preparation technique.
- Present and orally motivate the selected electron microscopy instrumentation for a selected sample.
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